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AFM(針 交換) - List of Manufacturers, Suppliers, Companies and Products | IPROS GMS

AFM Product List

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200mm Large Sample Compatible AFM/SPM Jupiter XR

200mm Large Sample Compatible AFM/SPM Jupiter XR

A large sample-compatible stage-type AFM/SPM (Atomic Force Microscope/Scanning Probe Microscope) with excellent resolution, speed, operability, and flexibility.

The Jupiter XR atomic force microscope is the industry's first large sample-compatible AFM/SPM that supports "ultra-high resolution," "high-speed imaging," and "wide-area scanning" with a single scanner without the need to change scanners. The sample stage allows access to the entire 200 mm sample area and inherits the excellent fundamental design and operability developed in the Cypher AFM (released in 2007), as well as the photothermal excitation 'blueDrive.' With its high level of balance, the Jupiter XR is the best choice for applications that require a variety of samples and applications in fields such as analytical science, industrial R&D, and academic research.

  • Microscope
  • AFM

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Ultra-high resolution, high-speed scanning AFM/SPM Cypher S

Ultra-high resolution, high-speed scanning AFM/SPM Cypher S

High precision, yet operation is surprisingly easy! The ideal AFM/SPM for measurements in both gas and liquid phases in the fields of materials science and life sciences.

Cypher S AFM/SPM (Atomic Force Microscope) demonstrates ultra-high resolution and high-speed performance! It achieves true atomic resolution in AC mode, which is also a testament to the ability to perform measurements with extremely low noise. There is no need to choose between the accuracy of closed-loop atomic resolution imaging and the low noise characteristics of open-loop; you can have both. The automatic laser alignment feature, SpotOn, is very user-friendly, eliminating the need for traditional manual operation. With a laser spot size of 3 μm, it enables high-speed AC imaging and low noise measurements using micro levers. The interchangeable modular design expands the options for applications and scanning modes. The built-in enclosure of the Cypher allows for thermal control and acoustic insulation, optimizing the stability of imaging and measurements, significantly improving thermal drift compared to conventional AFM/SPM. For more details, please contact us or refer to the catalog.

  • Other measurement, recording and measuring instruments
  • Microscope
  • AFM

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PiFM/AFM-IR Nano Chemical Imaging AFM

PiFM/AFM-IR Nano Chemical Imaging AFM

PiFM method AFM that visualizes chemical composition with nanometer resolution while observing shape.

This is a series of AFM-IR devices that adopt the light-induced force (PiFM) method. By detecting the light-induced force acting between the probe and the sample, it has achieved chemical mapping and point spectrum acquisition with spatial resolution surpassing that of FTIR and nano-FTIR. - It has single-molecule level surface sensitivity, visualizing the chemical composition of materials regardless of whether they are organic or inorganic. - Measurements are conducted in a non-contact and non-destructive manner, keeping both the sample and the tip in a clean state. - By correlating with existing FTIR spectra, materials can be identified from the acquired spectra. - The design maintains optical alignment even after sample exchange. - It accommodates a wide range of fields, including semiconductors, polymers, inorganic materials, and nanophotonics. - Multiple models are available for selection, differing in installation space, sample size, and level of automation. We will propose the optimal configuration according to your application and installation environment.

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  • Other microscopes
  • AFM

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